/ Home
/ SUBMISSION

/ The BJNANO
/ Diamond Open Access
/ Journal Statistics
/ Editorial Board
/ Community
/ Call for papers

/ Latest Articles
/ Most accessed
/ Thematic issues
/ Volumes
/ Authors

/ Alerts

/ TWITTER
/ LINKEDIN
/ Mastodon
/ RSS FEED

Empty search

Article Type

Publication Date Range

Search Tips

This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.

Search Examples

aromatic	the word “aromatic”
aromatic aldehyde	the word “aromatic” OR “aldehyde”
+aromatic +aldehyde	both words “aromatic” AND “aldehyde”
+aromatic -aldehyde	the word “aromatic” but NOT “aldehyde”
“aromatic aldehyde”	the exact phrase “aromatic aldehyde”
benz*	words which begin with “benz”, such as “benzene” or “benzyl”
benz*yl	words that begin with “benz” and end with “yl”, such as “benzyl” or “benzoyl”
benzyl~	words that are close to the word “benzyl”, such as “benzoyl” (i.e., fuzzy search)

BROWSE
Latest Articles
Most accessed
thematic issues
volumes
authors

BROWSE

Latest Articles Most Accessed Thematic Issues Volumes Authors

Author

2 article(s) from Fleming, Yves

Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

Lukasz Rzeznik,
Yves Fleming,
Tom Wirtz and
Patrick Philipp

Beilstein J. Nanotechnol. 2016, 7, 1113–1128, doi:10.3762/bjnano.7.104

PDF

Figure 1: Changing topography of PMMA bombarded by 5.5 keV Ne⁺ as a function of fluence (FOV: 1 × 1 µm²).

Jump to Figure 1

Figure 2: RMS roughness changing with primary He⁺ and Ne⁺ fluence when bombarding (a) PMMA and (b) PS.

Jump to Figure 2

Figure 3: Displacement of He, Ne and Ar from their initial positions in HD-PMMA sample at 300 K. No periodic ...

Jump to Figure 3

Figure 4: Mean square displacement (MSD) of helium, neon and argon at 300 K in a) HD-PE, b) HD-PS, c) HD-PMMA...

Jump to Figure 4

Figure 5: Implantation profiles in polyethylene obtained by SD_TRIM_SP for diffusion coefficient ranging from...

Jump to Figure 5

Figure 6: Surface sputtering vs swelling for different diffusion coefficients for helium irradiation of PE.

Jump to Figure 6

Figure 7: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PE at ...

Jump to Figure 7

Figure 8: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PTFE a...

Jump to Figure 8

Figure 9: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PMMA a...

Jump to Figure 9

Figure 10: Partial sputter yields for the different chemical elements sputtered from a) PTFE, b) PE, c) PMMA, ...

Jump to Figure 10

Figure 11: Surface composition as a function of impact energy for helium, neon and argon bombardment of a) F a...

Jump to Figure 11

Figure 12: Concentration profiles of F and C at a fluence of 10¹⁸ ions/cm² for He, Ne and Ar bombardment of PT...

Jump to Figure 12

Figure 13: Concentration profiles of H and C at a fluence of 10¹⁸ ions/cm² for He, Ne and Ar bombardment of PE...

Jump to Figure 13

Album

Full Research Paper

Published 02 Aug 2016

Full text

High sensitivity and high resolution element 3D analysis by a combined SIMS–SPM instrument

Yves Fleming and
Tom Wirtz

Beilstein J. Nanotechnol. 2015, 6, 1091–1099, doi:10.3762/bjnano.6.110

PDF

Figure 1: PVP/PS polymer blend after Cs⁺ bombardment of 1.02 × 10¹⁶ ions/cm²: The SIMS recorded secondary ion...

Jump to Figure 1

Figure 2: ⁵²Cr¹⁶O⁻ (a) and ²⁷Al¹⁶O⁻ (b) secondary ion intensity recorded by the NanoSIMS instrument during th...

Jump to Figure 2

Figure 3: Snapshot of SIMS-SPM reconstructed surface before (a) and during (b) SIMS analysis performed on Ti(...

Jump to Figure 3

Figure 4: Chemical image showing the ¹²C₂⁻ secondary ion intensity recorded from the TaN reticule with a 10 n...

Jump to Figure 4

Figure 5: 2D mapping of ²⁴Mg¹⁶O⁻ secondary ion signal summed over analysis depth (a). 3D volume reconstructio...

Jump to Figure 5

Album

Supp Info

Full Research Paper

Published 30 Apr 2015

Full text

Other Beilstein-Institut Open Science Activities

/ Help / Support & Contact / Alerts / Privacy Policy / Terms & Conditions / Impressum